Dr. Wolfram Lyda Profile

Dr. Wolfram Lyda

at Institut für Technische Optik

SPIE Involvement:

Author

Publications (23)

Proceedings Article | 1 May 2014 Paper

Optical design of a vertically integrated array-type Mirau-based OCT system

J. Krauter, T. Boettcher, W. Lyda, W. Osten, N. Passilly, L. Froehly, S. Bargiel, J. Albero, S. Perrin, J. Lullin, C. Gorecki

Proceedings Volume 9132, 91320L (2014) https://doi.org/10.1117/12.2054573

KEYWORDS: Optical coherence tomography, Interferometers, Optical design, Skin, Beam splitters, Sensors, Cameras, Imaging systems, Electroluminescent displays, Tissue optics

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Proceedings Article | 22 June 2013 Paper

Making, testing, applying: some progress in the field of micro-optics at ITO

W. Osten, G. Baer, M. Häfner, W. Lyda, C. Pruss, R. Reichle, F. Schaal

Proceedings Volume 8769, 876905 (2013) https://doi.org/10.1117/12.2020249

KEYWORDS: Sensors, Inspection, Aspheric lenses, Interferometers, Combustion, Micro optics, Chemical elements, Lithography, Microlens, Imaging systems

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Proceedings Article | 13 May 2013 Paper

Robust signal evaluation for Chromatic Confocal Spectral Interferometry

Tobias Boettcher, Wolfram Lyda, Marc Gronle, Florian Mauch, Wolfgang Osten

Proceedings Volume 8788, 87880W (2013) https://doi.org/10.1117/12.2020558

KEYWORDS: Confocal microscopy, Interferometry, Colorimetry, Wavelets, Sensors, Calibration, Diffractive optical elements, Interferometers, Objectives, Microscopes

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Proceedings Article | 13 May 2013 Paper

Model-based, active inspection of three-dimensional objects using a multi-sensor measurement system

Marc Gronle, Wolfram Lyda, Wolfgang Osten

Proceedings Volume 8788, 87880Y (2013) https://doi.org/10.1117/12.2020463

KEYWORDS: Inspection, Sensors, Data modeling, 3D modeling, Model-based design, Data acquisition, Actuators, Systems modeling, Clouds, Process modeling

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Proceedings Article | 13 May 2013 Paper

Model-based assistance system for confocal measurements of rough surfaces

F. Mauch, W. Lyda, W. Osten

Proceedings Volume 8788, 87880U (2013) https://doi.org/10.1117/12.2019991

KEYWORDS: Confocal microscopy, Sensors, Objectives, Lenses, Systems modeling, Inspection, Signal detection, Microscopes, Wavefronts, Neodymium

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SPIE Journal Paper | 9 May 2013 Open Access

Open-source graphics processing unit–accelerated ray tracer for optical simulation

Florian Mauch, Marc Gronle, Wolfram Lyda, Wolfgang Osten

OE, Vol. 52, Issue 05, 053004, (May 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.5.053004

KEYWORDS: Ray tracing, Optical simulations, Visualization, Graphics processing units, Computing systems, Optical design, Geometrical optics, Computer simulations, Optical engineering, Lithography

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Proceedings Article | 11 October 2012 Paper

Object-depending artifacts in confocal measurements

F. Mauch, W. Lyda, M. Gronle, W. Osten

Proceedings Volume 8466, 846609 (2012) https://doi.org/10.1117/12.929214

KEYWORDS: Confocal microscopy, Sensors, Signal processing, Mirrors, Wavefronts, Colorimetry, Neodymium, Calibration, Microscopes, Signal detection

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SPIE Journal Paper | 5 June 2012

Genetic programming applied to automatic algorithm design in multi-scale inspection systems

Avinash Burla, Tobias Haist, Wolfram Lyda, Wolfgang Osten

OE, Vol. 51, Issue 6, 067001, (June 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.6.067001

KEYWORDS: Genetics, Computer programming, Inspection, Detection and tracking algorithms, Binary data, Evolutionary algorithms, Sensors, Defect detection, Algorithm development, Optical engineering

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Proceedings Article | 5 May 2012 Paper

Multilevel optical sectioning based on digital holography with a femtosecond frequency comb laser

Klaus Körner, Giancarlo Pedrini, Igor Alexeenko, Wolfram Lyda, Tilo Steinmetz, Ronald Holzwarth, Wolfgang Osten

Proceedings Volume 8430, 843004 (2012) https://doi.org/10.1117/12.923563

KEYWORDS: Digital holography, Holograms, Frequency combs, Mirrors, Holography, Sensors, Femtosecond phenomena, Temporal coherence, Femtosecond frequency combs, Spherical lenses

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Proceedings Article | 28 April 2012 Paper

Extrinsic calibration of a fringe projection sensor based on a zoom stereo microscope in an automatic multiscale measurement system

Marc Gronle, Wolfram Lyda, Avinash Burla, Wolfgang Osten

Proceedings Volume 8430, 84300J (2012) https://doi.org/10.1117/12.922583

KEYWORDS: Sensors, Calibration, Zoom lenses, Clouds, Inspection, Microscopes, Data modeling, Data acquisition, Fringe analysis, Sensor calibration

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Proceedings Article | 27 May 2011 Paper

Conceptual consideration for the process integration of optical sensors

David Fleischle, Wolfram Lyda, Florian Mauch, Wolfgang Osten

Proceedings Volume 8082, 808204 (2011) https://doi.org/10.1117/12.890027

KEYWORDS: Sensors, Signal processing, Environmental sensing, Optical sensors, Optical testing, Signal detection, Manufacturing, Process control, Liquids, Inspection

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Proceedings Article | 27 May 2011 Paper

Automated alignment of aspheric and freeform surfaces in a non-null test interferometer

Goran Baer, Eugenio Garbusi, Wolfram Lyda, Christof Pruss, Wolfgang Osten

Proceedings Volume 8082, 80821L (2011) https://doi.org/10.1117/12.895010

KEYWORDS: Aspheric lenses, Interferometers, Phase measurement, Optical testing, Inspection, Current controlled current source, Interferometry, Spherical lenses

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Proceedings Article | 23 May 2011 Paper

Combining rigorous diffraction calculation and GPU accelerated nonsequential raytracing for high precision simulation of a linear grating spectrometer

Florian Mauch, David Fleischle, Wolfram Lyda, Wolfgang Osten, Torsten Krug, Reto Häring

Proceedings Volume 8083, 80830F (2011) https://doi.org/10.1117/12.889175

KEYWORDS: Spectroscopy, Diffraction gratings, Ray tracing, Stray light, Diffraction, Computer simulations, Light emitting diodes, Monte Carlo methods, Light scattering, Scattering

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Proceedings Article | 23 May 2011 Paper

Assistant systems for efficient multiscale measurement and inspection

Avinash Burla, Tobias Haist, Wolfram Lyda, Mohamed Hassanine Aissa, Wolfgang Osten

Proceedings Volume 8082, 808202 (2011) https://doi.org/10.1117/12.889344

KEYWORDS: Sensors, Inspection, Defect detection, Image processing, Genetic algorithms, Binary data, Genetics, Optical inspection, Microscopes, Detection and tracking algorithms

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SPIE Journal Paper | 1 April 2011

Fourier descriptors for defect indication in a multiscale and multisensor measurement system

Avinash Burla, Tobias Haist, Wolfram Lyda, Wolfgang Osten

OE, Vol. 50, Issue 04, 043603, (April 2011) https://doi.org/10.1117/12.10.1117/1.3562319

KEYWORDS: Lenses, Microlens array, Sensors, Confocal microscopy, Microscopes, Defect detection, Inspection, Microlens, Optical engineering, Monochromatic aberrations

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Proceedings Article | 14 September 2010 Paper

Optical metrology: from the laboratory to the real world

W. Osten, E. Garbusi, D. Fleischle, W. Lyda, C. Pruss, R. Reichle, C. Falldorf

Proceedings Volume 7387, 73871G (2010) https://doi.org/10.1117/12.873356

KEYWORDS: Inspection, Optical metrology, Sensors, Aspheric lenses, Image processing, Interferometers, Shearography, Digital micromirror devices, Mirrors, Chemical elements

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Proceedings Article | 8 September 2010 Paper

Rapid ideal template creation for the inspection of MEMS based on self-similarity characteristics

Avinash Burla, Tobias Haist, Wolfram Lyda, Anto Yesuadimai Michael, Wolfgang Osten

Proceedings Volume 7798, 77981W (2010) https://doi.org/10.1117/12.860359

KEYWORDS: Image segmentation, Microelectromechanical systems, Sensors, Calibration, Inspection, Image processing algorithms and systems, Optical resolution, Image processing, Actuators, Edge detection

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SPIE Journal Paper | 1 September 2010

Automated surface positioning for a non-null test interferometer

Goran Baer, Eugenio Garbusi, Wolfram Lyda, Wolfgang Osten

OE, Vol. 49, Issue 09, 095602, (September 2010) https://doi.org/10.1117/12.10.1117/1.3488051

KEYWORDS: Interferometers, Aspheric lenses, Optical spheres, Cameras, Interferometry, Monochromatic aberrations, Optical engineering, Spherical lenses, Phase measurement, Optical alignment

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Proceedings Article | 2 August 2010 Paper

An assistance system for the selection of sensors in multi-scale measurement systems

Avinash Burla, Tobias Haist, Wolfram Lyda, Wolfgang Osten

Proceedings Volume 7791, 77910I (2010) https://doi.org/10.1117/12.860368

KEYWORDS: Sensors, Inspection, Cameras, Computing systems, Optical inspection, Imaging systems, Systems modeling, Light sources and illumination, Optical testing, Defect detection

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Proceedings Article | 14 May 2010 Paper

Automated multiscale measurement system for MEMS characterisation

W. Lyda, A. Burla, T. Haist, J. Zimmermann, W. Osten, O. Sawodny

Proceedings Volume 7718, 77180G (2010) https://doi.org/10.1117/12.853819

KEYWORDS: Sensors, Microelectromechanical systems, Inspection, Calibration, Confocal microscopy, Image segmentation, Image processing, Pollution, Microscopes, Microlens array

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Proceedings Article | 14 May 2010 Paper

Optical metrology for process control: modeling and simulation of sensors for a comparison of different measurement principles

D. Fleischle, W. Lyda, F. Mauch, W. Osten

Proceedings Volume 7718, 77181D (2010) https://doi.org/10.1117/12.855053

KEYWORDS: Sensors, Interferometry, Confocal microscopy, Colorimetry, Process control, Control systems, Data modeling, Optical testing, Bidirectional reflectance transmission function, Manufacturing

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Proceedings Article | 10 September 2009 Paper

Chromatic confocal spectral interferometry for technical surface characterization

W. Lyda, D. Fleischle, T. Haist, W. Osten

Proceedings Volume 7432, 74320Z (2009) https://doi.org/10.1117/12.826902

KEYWORDS: Sensors, Confocal microscopy, Interferometry, Colorimetry, Data modeling, Mirrors, Interferometers, Diffractive optical elements, Bidirectional reflectance transmission function, Wavelets

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Proceedings Article | 17 June 2009 Paper

Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopy

W. Lyda, J. Zimmermann, A. Burla, J. Regin, W. Osten, O. Sawodny, E. Westkämper

Proceedings Volume 7389, 738903 (2009) https://doi.org/10.1117/12.827534

KEYWORDS: Confocal microscopy, Sensors, Actuators, Microscopes, Microlens, Microlens array, Control systems, Systems modeling, Error analysis, Mirrors

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Showing 5 of 23 publications

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