Dr. Maciej Baranski Profile

Dr. Maciej Baranski

Ph.D Student at FEMTO-ST

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 27 February 2015 Paper

Technological platform for vertical multi-wafer integration of miniature imaging instruments

S. Bargiel, M. Baranski, N. Passilly, C. Gorecki, M. Wiemer, J. Frömel, D. Wünsch, W. Wang

Proceedings Volume 9375, 93750L (2015) https://doi.org/10.1117/12.2078007

KEYWORDS: Glasses, Silicon, Microlens, Semiconducting wafers, Wafer-level optics, Confocal microscopy, Etching, Microscopes, Microopto electromechanical systems, Beam splitters

Read Abstract +

Proceedings Article | 18 August 2014 Paper

Simple setup for optical characterization of microlenses

Stephane Perrin, Maciej Baranski, Nicolas Passilly, Luc Froehly, Jorge Albero, Sylwester Bargiel, Christophe Gorecki

Proceedings Volume 9204, 92040D (2014) https://doi.org/10.1117/12.2061299

KEYWORDS: Microlens, Modulation transfer functions, Imaging systems, Optical components, Microscopes, Objectives, Molybdenum, Wavefronts, 3D metrology, Etching

Read Abstract +

Proceedings Article | 2 May 2014 Paper

Arrays of millimeter-sized glass lenses for miniature inspection systems

J. Albero, S. Perrin, S. Bargiel, M. Baranski, N. Passilly, L. Gauthier-Manuel, C. Gorecki

Proceedings Volume 9130, 91300U (2014) https://doi.org/10.1117/12.2051043

KEYWORDS: Glasses, Microlens, Silicon, Lenses, Inspection, Semiconducting wafers, Fabrication, Matrices, Microlens array, Deep reactive ion etching

Read Abstract +

Proceedings Article | 1 May 2014 Paper

Metrology of micro-optical components quality using direct measurement of 3D intensity point spread function

Maciej Baranski, Stephane Perrin, Nicolas Passilly, Luc Froehly, Sylwester Bargiel, Jorge Albero, Christophe Gorecki

Proceedings Volume 9132, 913216 (2014) https://doi.org/10.1117/12.2051122

KEYWORDS: 3D metrology, Optical components, Objectives, Imaging systems, Point spread functions, Microscopes, Cameras, Microlens, CMOS cameras, High dynamic range imaging

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years