Dr. Marie-Françoise Ravet-Krill
Research Engineer
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 3 April 2008 Paper
R. Mercier Ythier, X. Bozec, R. Geyl, A. Rinchet, Christophe Hecquet, Marie-Françoise Ravet-Krill, Franck Delmotte, Benoît Sassolas, Raffaele Flaminio, Jean-Marie Mackowski, Christophe Michel, Jean-Luc Montorio, Nazario Morgado, Laurent Pinard, Elodie Roméo
Proceedings Volume 6921, 692135 (2008) https://doi.org/10.1117/12.787620
KEYWORDS: Reflectivity, Mirrors, Coating, Extreme ultraviolet, Plasma, Manufacturing, Polishing, Annealing, Grazing incidence, Silicon carbide

Proceedings Article | 3 October 2007 Paper
Frédéric Auchère, Marie-Françoise Ravet-Krill, John Moses, Frédéric Rouesnel, Jean-Pierre Moalic, Denis Barbet, Christophe Hecquet, Arnaud Jérome, Raymond Mercier, Jean-Christophe Leclec'h, Franck Delmotte, Jeffrey Newmark
Proceedings Volume 6689, 66890A (2007) https://doi.org/10.1117/12.751447
KEYWORDS: Coronagraphy, Reflectivity, Mirrors, Multilayers, Coating, Extreme ultraviolet, Helium, Solar processes, Rockets, Stray light

Proceedings Article | 20 September 2007 Paper
Proceedings Volume 6689, 66890S (2007) https://doi.org/10.1117/12.731784
KEYWORDS: Extreme ultraviolet, Mirrors, Space telescopes, Sensors, Telescopes, Electronics, Space operations, Thermal modeling, Multilayers, Sun

Proceedings Article | 20 September 2007 Paper
J. Gautier, A. S. Morlens, P. Zeitoun, G. Rey, C. Valentin, E. Papalarazou, J. P. Goddet, S. Sebban, F. Delmotte, M. F. Ravet, F. Bridou
Proceedings Volume 6705, 67050C (2007) https://doi.org/10.1117/12.732424
KEYWORDS: Mirrors, Reflectivity, Holography, Holograms, Multilayers, Silicon, Extreme ultraviolet, Microscopy, Digital holography, X-rays

Proceedings Article | 18 May 2007 Paper
Christophe Hecquet, Marie-Françoise Ravet-Krill, Franck Delmotte, Arnaud Jérôme, Aurélie Hardouin, Françoise Bridou, Françoise Varnière, Marc Roulliay, Frédéric Bourcier, Jean-Michel Desmarres, Vincent Costes, Jacques Berthon, André Rinchet, Roland Geyl
Proceedings Volume 6586, 65860X (2007) https://doi.org/10.1117/12.723483
KEYWORDS: Reflectivity, Extreme ultraviolet, Multilayers, Extreme ultraviolet lithography, Humidity, Annealing, Reflectometry, Silicon carbide, Silicon, Space operations

Showing 5 of 17 publications
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