Dr. Ming-Chung Liu Profile

Dr. Ming-Chung Liu

Student at National Central Univ

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Author

Publications (6)

Proceedings Article | 22 September 2011 Paper

The research of relationships between residual stress and columnar angles in oblique deposition of magnesium fluoride thin films

Cheng-Chung Jaing, Ming-Chung Liu, Wen-Hao Cho, Chien-Jen Tang, Yeuh-Yeong Liou, Jun-Yuan Wang, Cheng-Chung Lee

Proceedings Volume 8128, 81280K (2011) https://doi.org/10.1117/12.892380

KEYWORDS: Magnesium fluoride, Glasses, Thin films, Phase shifts, Scanning electron microscopy, Interferometers, Molybdenum, Thin film coatings, Refractive index, Ferroelectric materials

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Proceedings Article | 29 August 2008 Paper

Microstructure- and optic-related characteristics of magnesium oxide thin film

Ming-Chung Liu, Shih-Chin Yang, Cheng-Chung Lee, Shih-Pu Chen, Jung-Yu Li, Yi-Ping Lin

Proceedings Volume 7067, 70670H (2008) https://doi.org/10.1117/12.794865

KEYWORDS: Thin films, Annealing, Magnesium, Oxides, Heat treatments, Crystals, Ions, Surface roughness, Transmittance, Plasma display panels

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Proceedings Article | 11 September 2007 Paper

Characterization of AlF3 thin films in the ultraviolet by magnetron sputtering of aluminum target

Bo-Huei Liao, Ming-Chung Liu, Cheng-Chung Lee

Proceedings Volume 6645, 66451X (2007) https://doi.org/10.1117/12.733550

KEYWORDS: Sputter deposition, Thin films, Refractive index, Aluminum, Transmittance, Ultraviolet radiation, Surface roughness, Chemical species, Fluorine, Carbon

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Proceedings Article | 11 September 2007 Paper

The research of oblique deposition of lanthanum fluoride thin films at 193nm

Ming-Chung Liu, Bo-Huei Liao, Wen-Hao Cho, Cheng-Chung Lee, Cheng-Chung Jaing

Proceedings Volume 6645, 66451Y (2007) https://doi.org/10.1117/12.733616

KEYWORDS: Thin films, Birefringence, Refractive index, Neptunium, Lanthanum, Resistance, Scanning electron microscopy, Thin film deposition, Particles, Deep ultraviolet

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SPIE Journal Paper | 1 August 2006

Microstructure- and composition-related characteristics of LaF₃ thin films at 193 nm

Ming-Chung Liu, Cheng-Chung Lee, Masaaki Kaneko, Kazuhide Nakahira, Yuuichi Takano

OE, Vol. 45, Issue 08, 083801, (August 2006) https://doi.org/10.1117/12.10.1117/1.2227001

KEYWORDS: Thin films, Optical properties, Transmittance, Refractive index, Temperature metrology, Thin film deposition, Scanning electron microscopy, Lanthanum, Crystals, Optical engineering

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Proceedings Article | 20 August 2005 Paper

Effects of ion assist and substrate temperature on the optical properties and microstructure of MgF2 films produced by e-beam evaporation

Cheng-Chung Jaing, Ming-Hua Shiao, Cheng-Chung Lee, Chih-Jung Lu, Ming-Chung Liu, Chin-Han Lee, His-Chao Chen

Proceedings Volume 5870, 58700F (2005) https://doi.org/10.1117/12.614753

KEYWORDS: Ions, Surface roughness, Crystals, Fluorine, Optical properties, Transmission electron microscopy, Magnesium fluoride, Photomicroscopy, Thin films, X-ray diffraction

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Showing 5 of 6 publications

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