Nathan Neal
at GLOBALFOUNDRIES Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 November 2024 Poster + Paper
Proceedings Volume 13216, 132162J (2024) https://doi.org/10.1117/12.3034703
KEYWORDS: Photomasks, Semiconducting wafers, Optical proximity correction, Simulations, Optical lithography, Phase shifts

Proceedings Article | 22 January 2018 Presentation + Paper
Jennifer Shumway, Nathan Neal, Sheldon Meyers, Jens Reichelt, Young Ki Kim, Justin Hanson, Ferhad Kamalizadeh, Dionysios Petromanolakis, Youri van Dommelen, Robert Bonanni, Arjan Gijsbertsen
Proceedings Volume 10147, 101470B (2018) https://doi.org/10.1117/12.2258391
KEYWORDS: Optical lithography, Current controlled current source, Calibration, Scanners, Reticles, Monochromatic aberrations, Software development, Semiconducting wafers

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