Prof. Andrew I. Sheinis
Head of Instrumentation at Canada-France-Hawaii Telescope Corp
SPIE Involvement:
Author | Instructor
Area of Expertise:
Astronomical Instrumentation , Spectroscopy
Publications (49)

Proceedings Article | 29 August 2022 Presentation + Paper
Proceedings Volume 12184, 121841C (2022) https://doi.org/10.1117/12.2630603
KEYWORDS: Optical fibers, Spectrographs, Spectroscopy, Telescopes, Spectroscopes, Galactic astronomy, Astronomical imaging, Observatories, Data archive systems, Spine

Proceedings Article | 26 August 2022 Presentation + Paper
Proceedings Volume 12182, 1218214 (2022) https://doi.org/10.1117/12.2629439
KEYWORDS: Astronomy, Telescopes, Spectroscopy, Spectrographs, Observatories, Multiplexing, Optical instrument design, Optical fibers, Spectral resolution

Proceedings Article | 10 July 2018 Paper
Michael Edgar, Ross Zhelem, Lewis Waller, Janez Kos, Don Mayfield, Naveen Pai, Andrew Sheinis, Gayandhi De Silva, Jeffrey Simpson, Nicholas Stazak
Proceedings Volume 10706, 1070633 (2018) https://doi.org/10.1117/12.2307305
KEYWORDS: Glasses, Sensors, Charge-coupled devices, Cameras, Silicon, Particles, Lenses, Lanthanum, Spectroscopy

Proceedings Article | 10 July 2018 Paper
Robert Content, Antonio de Ugarte Postigo, Christina Thöne, Andrew Sheinis
Proceedings Volume 10706, 107066L (2018) https://doi.org/10.1117/12.2314424
KEYWORDS: Mirrors, Spectrographs, Near infrared, Adaptive optics, Telescopes, Gemini Observatory, Sensors, Cameras

Proceedings Article | 6 July 2018 Paper
Proceedings Volume 10702, 107021M (2018) https://doi.org/10.1117/12.2310021
KEYWORDS: Spine, Actuators, Metrology, Telescopes, Calibration

Showing 5 of 49 publications
Course Instructor
SC906: Introduction to Visible and NIR Spectrograph Design and Development for Astronomy
This course provides attendees with an introduction to aerial spectrograph design and development for astronomy. The course concentrates on system configurations and performance optimization and analysis. Specific concepts to be addressed include: image quality, throughput, flexure, performance modeling and system testing.
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