Phil Stopford
at Synopsys Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 May 2023 Presentation + Paper
Maryvonne Chalony, Lawrence Melvin, Rainer Zimmermann, Bernd Küchler, Emilie Viasnoff, Robert Scarmozzino, Daniel Herrmann, Yves Saad, Phil Stopford, Thuc Dam, Ulrich Klostermann, Wolfgang Demmerle, Al Blais, Remco Stoffer
Proceedings Volume 12499, 124990A (2023) https://doi.org/10.1117/12.2658788
KEYWORDS: Design and modelling, Manufacturing, Polarization, Optics manufacturing, Photonic devices, Optical lithography, Incident light, Metalenses, Geometrical optics, Optical proximity correction

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12495, 124950W (2023) https://doi.org/10.1117/12.2658780
KEYWORDS: Stochastic processes, Resistance, Simulations, Overlay metrology, Optical lithography, Lithography, Optical proximity correction, Ruthenium, Etching

Proceedings Article | 23 March 2020 Presentation + Paper
Dominik Metzler, Mohamed Oulmane, Sagarika Mukesh, Phil Stopford, Karthik Yogendra, Lawrence Melvin
Proceedings Volume 11329, 113290H (2020) https://doi.org/10.1117/12.2551731
KEYWORDS: Defect inspection, Etching, Photoresist materials, Photomasks, Stochastic processes, Dielectrics, Data modeling, Process modeling, Lithography, Metals

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