Sagar Saxena
at Siemens EDA
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume 12954, 1295415 (2024) https://doi.org/10.1117/12.3010925
KEYWORDS: Optical proximity correction, Lithography

Proceedings Article | 28 April 2023 Paper
Proceedings Volume 12495, 124950K (2023) https://doi.org/10.1117/12.2647882
KEYWORDS: SRAF, Optical proximity correction, Machine learning, Lithography, Simulations

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