Dr. Adam R. Styk Profile

Dr. Adam R. Styk

Assistant Professor at Warsaw Univ. of Technology

SPIE Involvement:

Conference Program Committee | Author

Publications (24)

Proceedings Article | 15 August 2023 Presentation + Paper

Laser tracker system supporting 3D digital image correlation with dispersed measurement fields of view

A. Styk, D. Budiakivska, M. Jankowski, T. Kowaluk, M. Kujawińska

Proceedings Volume 12618, 126181Q (2023) https://doi.org/10.1117/12.2673881

KEYWORDS: Digital image correlation, 3D metrology, Laser soldering, 3D tracking, Optical spheres, Calibration, 3D image processing, Cameras, Engineering, Imaging systems

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Proceedings Article | 21 June 2019 Presentation + Paper

Bessel fringes modulation determination by directional spatial carrier phase shifting

Adam Styk, Helena Dziubecka

Proceedings Volume 11056, 1105603 (2019) https://doi.org/10.1117/12.2526252

KEYWORDS: Modulation, Fringe analysis, Phase shifting, Interferometry, Bessel functions, Phase shifts, Computer simulations, Image processing

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Proceedings Article | 21 June 2019 Paper

Comparison of algorithms determining sign of Bessel function in time averaging interferometry

Helena Dziubecka, Adam Styk

Proceedings Volume 11056, 1105605 (2019) https://doi.org/10.1117/12.2526097

KEYWORDS: Bessel functions, Phase shifts, Digital signal processing, Interferometry, Principal component analysis, Modulation, Phase shifting

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Proceedings Article | 7 September 2018 Paper

Phase shift strategies in phase shifting time averaging interferometry for harmonic motion measurements

Adam Styk, Helena Dziubecka

Proceedings Volume 10834, 108342C (2018) https://doi.org/10.1117/12.2319769

KEYWORDS: Phase shifts, Phase shifting, Interferometry, Digital signal processing, Bessel functions, Fringe analysis

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Proceedings Article | 18 August 2018 Presentation + Paper

Vibration amplitude determination through besselogram modulation analysis

Adam Styk

Proceedings Volume 10749, 107490B (2018) https://doi.org/10.1117/12.2321596

KEYWORDS: Modulation, Phase shifts, Phase shifting, Interferometry, Bessel functions, Error analysis, Fringe analysis

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Proceedings Article | 28 August 2016 Presentation + Paper

Recent advances in phase shifted time averaging and stroboscopic interferometry

Adam Styk, Michał Józwik

Proceedings Volume 9960, 99600A (2016) https://doi.org/10.1117/12.2238519

KEYWORDS: Interferometry, Phase shifts, Time metrology, Phase shifting, Modulation, Error analysis, Bessel functions, Photovoltaics, Data processing, Visualization

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Proceedings Article | 8 October 2015 Open Access

Double degree master program: Optical Design

Alexey Bakholdin, Malgorzata Kujawinska, Irina Livshits, Adam Styk, Anna Voznesenskaya, Kseniia Ezhova, Elena Ermolayeva, Tatiana Ivanova, Galina Romanova, Nadezhda Tolstoba

Proceedings Volume 9793, 979307 (2015) https://doi.org/10.1117/12.2223055

KEYWORDS: Optical design, Optical engineering, Optics manufacturing, Internships, Optical testing, Mechatronics, Photonics, Software, Computer simulations, Optical metrology

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Proceedings Article | 18 August 2014 Paper

Comparison of full-field interferometric measurement techniques applied to small vibration amplitudes determination

Adam Styk

Proceedings Volume 9203, 92030V (2014) https://doi.org/10.1117/12.2062137

KEYWORDS: Cameras, Demodulation, Modulation, Interferometry, Phase shift keying, Calibration, Modulators, Imaging systems, Signal processing, Phase shifts

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Proceedings Article | 3 November 2011 Paper

Parallel approach to MEMS and micro-optics interferometric testing

M. Kujawińska, S. Beer, K. Gastinger, C. Gorecki, K. Haugholt, M. Józwik, P. Lambelet, R. Paris, A. Styk, U. Zeitner

Proceedings Volume 8011, 80117O (2011) https://doi.org/10.1117/12.903256

KEYWORDS: Semiconducting wafers, Interferometers, Inspection, Diffractive optical elements, Wafer-level optics, Imaging systems, Interferometry, Lithium, Microelectromechanical systems, Micro optics

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Proceedings Article | 27 May 2011 Paper

Vibration amplitude recovery from time averaged interferograms using the directional spatial carrier phase shifting method

A. Styk, M. Brzeziński

Proceedings Volume 8082, 80821X (2011) https://doi.org/10.1117/12.889475

KEYWORDS: Phase shifting, Fringe analysis, Photovoltaics, Interferometry, Bessel functions, Phase shifts, Modulation, Error analysis, Algorithm development, Reconstruction algorithms

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Proceedings Article | 14 September 2010 Paper

Smart pixel camera based signal processing in an interferometric test station for massive parallel inspection of MEMS and MOEMS

Adam Styk, Patrick Lambelet, Arne Røyset, Małgorzata Kujawińska, Kay Gastinger

Proceedings Volume 7387, 73870M (2010) https://doi.org/10.1117/12.871522

KEYWORDS: Cameras, Demodulation, Interferometers, Interferometry, Imaging systems, Inspection, Signal detection, Signal processing, Data processing, Modulation

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Proceedings Article | 14 September 2010 Paper

Portable profilometer based on low-coherence interferometry and smart pixel camera

Leszek Salbut, Anna Pakuła, Sławomir Tomczewski, Adam Styk

Proceedings Volume 7387, 738714 (2010) https://doi.org/10.1117/12.871532

KEYWORDS: Profilometers, Cameras, Mirrors, Interferometry, Light sources, Imaging systems, Optical coherence tomography, Connectors, Light emitting diodes, Beam splitters

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Proceedings Article | 2 August 2010 Paper

Design, technology, and signal processing for DOE-based microinterferometer array applied in new generation M(O)EMS test equipment

M. Kujawinska, M. Józwik, A. Styk, U. Zeitner, A. Røyset, S. Beer, R. Moosburger, C. Gorecki, K. Gastinger

Proceedings Volume 7791, 779103 (2010) https://doi.org/10.1117/12.862170

KEYWORDS: Interferometers, Semiconducting wafers, Cameras, Lithium, Imaging systems, Inspection, Diffraction gratings, Demodulation, Signal processing, Wafer-level optics

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Proceedings Article | 20 November 2008 Paper

Quasi-parallel glass plate measurements using Fizeau interferometer

Adam Styk, Krzysztof Patorski

Proceedings Volume 7141, 71410S (2008) https://doi.org/10.1117/12.822373

KEYWORDS: Modulation, Fringe analysis, Phase shift keying, Fizeau interferometers, Glasses, Mendelevium, Optical testing, Phase shifting, Interferometry, Atrial fibrillation

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Proceedings Article | 11 August 2008 Paper

Fizeau interferometer for quasi parallel optical plate testing

Adam Styk, Krzysztof Patorski

Proceedings Volume 7063, 70630P (2008) https://doi.org/10.1117/12.794488

KEYWORDS: Modulation, Phase shift keying, Fringe analysis, Fizeau interferometers, Optical testing, Interferometry, Atrial fibrillation, Phase shifting, Phase shifts, Refractive index

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Proceedings Article | 18 June 2007 Paper

Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometer

Adam Styk, Krzysztof Patorski

Proceedings Volume 6616, 66161W (2007) https://doi.org/10.1117/12.726141

KEYWORDS: Modulation, Fringe analysis, Phase shift keying, Mendelevium, Fizeau interferometers, Phase shifting, Phase shifts, Glasses, Interferometers, Interferometry

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Proceedings Article | 14 August 2006 Paper

Detection and assessment of the nonuniform phase displacement error in temporal phase shifting interferometry

Krzysztof Patorski, Adam Styk, Luigi Bruno, Piotr Szwaykowski

Proceedings Volume 6292, 629207 (2006) https://doi.org/10.1117/12.679810

KEYWORDS: Phase shifts, Calibration, Ferroelectric materials, Detection and tracking algorithms, Modulation, Phase shift keying, Interferometers, Double patterning technology, Phase interferometry, Sensors

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Proceedings Article | 14 August 2006 Paper

Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

Adam Styk, Krzysztof Patorski

Proceedings Volume 6292, 62920A (2006) https://doi.org/10.1117/12.679058

KEYWORDS: Modulation, Phase shift keying, Error analysis, Phase shifting, Bessel functions, Phase shifts, Fringe analysis, Numerical simulations, Interferometry, Data processing

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SPIE Journal Paper | 1 August 2006

Interferogram intensity modulation calculations using temporal phase shifting: error analysis

Krzysztof Patorski, Adam Styk

OE, Vol. 45, Issue 08, 085602, (August 2006) https://doi.org/10.1117/12.10.1117/1.2338595

KEYWORDS: Modulation, Phase shift keying, Error analysis, Solids, Phase shifts, Optical engineering, Computer simulations, Fringe analysis, Visualization, Phase shifting

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Proceedings Article | 12 October 2005 Paper

Theory and practice of two-beam interferogram modulation determination

Krzysztof Patorski, Adam Styk

Proceedings Volume 5958, 59580H (2005) https://doi.org/10.1117/12.622171

KEYWORDS: Modulation, Phase shift keying, Error analysis, Solids, Phase shifts, Visualization, Computer simulations, Charge-coupled devices, Phase shifting, Numerical simulations

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Proceedings Article | 13 June 2005 Paper

Interferogram intensity modulation calculations using temporal phase shifting: error analysis

Krzysztof Patorski, Adam Styk

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612097

KEYWORDS: Modulation, Phase shift keying, Solids, Error analysis, Phase shifting, Fringe analysis, Phase shifts, Visualization, Silicon, Charge-coupled devices

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SPIE Journal Paper | 1 June 2005

Phase-shifting method contrast calculations in time-averaged interferometry: error analysis

Krzysztof Patorski, Zbigniew Sienicki, Adam Styk

OE, Vol. 44, Issue 06, 065601, (June 2005) https://doi.org/10.1117/12.10.1117/1.1926887

KEYWORDS: Modulation, Phase shift keying, Phase shifts, Error analysis, Solids, Optical engineering, Fringe analysis, Silicon, Bessel functions, Visualization

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Proceedings Article | 17 August 2004 Paper

Studies of the properties of the temporal phase-shifting method applied to silicone microelement vibration investigations using the time-average method

Krzysztof Patorski, Zbigniew Sienicki, Michal Pawlowski, Adam Styk, Agata Józwicka

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.545450

KEYWORDS: Modulation, Phase shift keying, Silicon, Error analysis, Fringe analysis, Solids, Phase shifts, Phase shifting, Visualization, Bessel functions

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Proceedings Article | 17 August 2004 Paper

Interferometric methods for static and dynamic characterizations of micromembranes for sensing functions

Leszek Salbut, Jacek Kacperski, Adam Styk, Michal Jozwik, Christophe Gorecki, Hakan Urey, Alain Jacobelli, Thierry Dean

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.545574

KEYWORDS: Interferometry, Semiconducting wafers, Manufacturing, Silicon, Electrodes, Phase interferometry, Shape analysis, Ferroelectric materials, Bessel functions, Statistical analysis

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Showing 5 of 24 publications

Conference Committee Involvement (5)

Interferometry and Structured Light 2024

21 August 2024 | San Diego, California, United States

Interferometry XXI

24 August 2022 | San Diego, California, United States

Interferometry XX

24 August 2020 | Online Only, California, United States

Interferometry XIX

21 August 2018 | San Diego, California, United States

Interferometry XVIII

30 August 2016 | San Diego, California, United States

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