Dr. Anthony S. Holland Profile

Dr. Anthony S. Holland

Research Fellow at RMIT Univ

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Author

Publications (27)

Proceedings Article | 22 December 2015 Paper

Optimisation of Schottky electrode geometry

Stanley Luong, Mohammad Saleh Alnassar, Pan Yue, Anthony Holland

Proceedings Volume 9668, 96685P (2015) https://doi.org/10.1117/12.2202531

KEYWORDS: Electrodes, Diodes, TCAD, Finite element methods, Electronics, Amplifiers, Modeling, 3D modeling, Data modeling, Metals, Resistance

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Proceedings Article | 26 December 2013 Paper

Four point probe geometry modified correction factor for determining resistivity

Fahid Algahtani, Karthikram Thulasiram, Nashrul Nasir, Anthony Holland

Proceedings Volume 8923, 89235D (2013) https://doi.org/10.1117/12.2034057

KEYWORDS: Resistance, Modeling, Thin films, Finite element methods, Computer simulations, Computer engineering, Mechatronics, Analytical research, Statistical analysis, Semiconductors

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Proceedings Article | 20 December 2013 Paper

Investigation of amorphisation of germanium using modeling and experimental processes

S. Almalki, F. Algahtani, M. Blackford, M. Alnassar, B. Johnson, J. McCallum, A. Holland

Proceedings Volume 8923, 89235H (2013) https://doi.org/10.1117/12.2035093

KEYWORDS: Germanium, Transmission electron microscopy, Nickel, Ion implantation, Crystals, Ions, Process modeling, Diffraction, Heat treatments, Statistical modeling

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Proceedings Article | 7 December 2013 Paper

A novel single dot test structure for determining specific contact resistivity

Yue Pan, Aaron Collins, Anthony Holland

Proceedings Volume 8923, 89232Q (2013) https://doi.org/10.1117/12.2034077

KEYWORDS: Resistance, Finite element methods, Electrodes, Data modeling, Semiconductors, Metals, Error analysis, Bessel functions, Interfaces, Computer engineering

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Proceedings Article | 7 December 2013 Paper

Investigating extremely low resistance ohmic contacts to silicon carbide using a novel test structure

Yue Pan, Aaron Collins, Fahid Algahtani, Patrick Leech, Geoffrey Reeves, Philip Tanner, Anthony Holland

Proceedings Volume 8923, 892356 (2013) https://doi.org/10.1117/12.2033910

KEYWORDS: Silicon carbide, Resistance, Nickel, Electrodes, Heat treatments, Semiconductors, Metals, Temperature metrology, Bessel functions, Nitrogen

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Proceedings Article | 7 December 2013 Paper

Improved geometrical design of the circular transmission line model ohmic contact test structure

Aaron Collins, Yue Pan, Anthony Holland

Proceedings Volume 8923, 892359 (2013) https://doi.org/10.1117/12.2033920

KEYWORDS: Resistance, Modeling, Statistical analysis, Structural design, Semiconductors, Mathematical modeling, Holographic optical elements, Current controlled current source, Bessel functions, Error analysis

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Proceedings Article | 7 December 2013 Paper

Optimizing the thermal budget for forming of nickel germanide on crystalline germanium

F. Algahtani, M. Blackford, E. Pirogova, A. Holland

Proceedings Volume 8923, 89235A (2013) https://doi.org/10.1117/12.2034001

KEYWORDS: Nickel, Germanium, Crystals, Silicon, Transmission electron microscopy, Diffraction, Resistance, Metals, Interfaces, Heat treatments

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Proceedings Article | 9 January 2008 Paper

Etching lithium niobate during Ti diffusion process

V. Sivan, L. Bui, D. Venkatachalam, S. Bhargava, T. Priest, A. Holland, A. Mitchell

Proceedings Volume 6800, 68001J (2008) https://doi.org/10.1117/12.759612

KEYWORDS: Titanium, Semiconducting wafers, Diffusion, Niobium, Ions, Etching, Lithium, Oxygen, Lithium niobate, Crystals

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Proceedings Article | 11 January 2007 Paper

Nickel silicide and titanium silicide formation: a comparison

Madhu Bhaskaran, Sharath Sriram, Anthony Holland, Johan du Plessis

Proceedings Volume 6414, 64141B (2007) https://doi.org/10.1117/12.695939

KEYWORDS: Nickel, Titanium, Silicon, Silicon films, Thin films, Metals, Annealing, Sputter deposition, Oxygen, Atomic force microscopy

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Proceedings Article | 20 December 2006 Paper

Surface morphology and stress analysis of piezoelectric strontium-doped lead zirconate titanate thin films

Sharath Sriram, Madhu Bhaskaran, Anthony Holland

Proceedings Volume 6415, 64150J (2006) https://doi.org/10.1117/12.695941

KEYWORDS: Thin films, Thin film deposition, Gold, Platinum, Sputter deposition, Ferroelectric materials, Surface roughness, Silicon, Silicon films, Atomic force microscopy

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Proceedings Article | 19 January 2006 Paper

Droplet manipulation for lab-on-a-chip using electrowetting

T. Mahmud, G. Rosengarten, A. Holland

Proceedings Volume 6036, 60361Z (2006) https://doi.org/10.1117/12.661301

KEYWORDS: Electrodes, Dielectrics, Dewetting, Interfaces, Liquids, Aluminum, Platinum, Lab on a chip, Silica, Solids

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Proceedings Article | 5 January 2006 Paper

Specific contact resistivity of Al-NiSi contacts using Cross Kelvin Resistor test structure chains

Anthony Holland, Madhu Bhaskaran, Sharath Sriram, Geoffrey Reeves, Vykundh Ravichandran, Vishal Borase, Shreekkanth Bhaskaran

Proceedings Volume 6035, 60350X (2006) https://doi.org/10.1117/12.650699

KEYWORDS: Nickel, Silicon, Resistors, Resistance, Metals, Aluminum, Sputter deposition, Oxides, Interfaces, Error analysis

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Proceedings Article | 5 January 2006 Paper

Comparative study of surface acoustic wave based hydrogen sensors with: InO_x/SiN_x/36° YX LiTaO₃ structure

Alexandru Fechete, Wojtek Wlodarski, Kourosh Kalantar-zadeh, Anthony Holland, Jarek Antosziewski, Saulius Kaciulis, Luca Pandolfi

Proceedings Volume 6035, 603517 (2006) https://doi.org/10.1117/12.638505

KEYWORDS: Sensors, Indium oxide, Plasma enhanced chemical vapor deposition, Magnetic sensors, Sputter deposition, Hydrogen, Thin films, Acoustics, Gas sensors, Wave sensors

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Proceedings Article | 4 January 2006 Paper

RF magnetron sputter deposition and analysis of strontium-doped lead zirconate titanate thin films

Sharath Sriram, Madhu Bhaskaran, Anthony Holland, Ernest Fardin, Sasikaran Kandasamy

Proceedings Volume 6037, 603723 (2006) https://doi.org/10.1117/12.668052

KEYWORDS: Sputter deposition, Platinum, Gold, Scanning electron microscopy, Ferroelectric materials, Thin films, Titanium, Photomicroscopy, Lead, Perovskite

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Proceedings Article | 6 October 2005 Paper

In situ SHG monitoring of dipolar orientation and relaxation in Disperse Red type/derivative urethane-urea copolymer

A. Samoc, A. Holland, M. Tsuchimori, O. Watanabe, M. Samoc, B. Luther-Davies, V. Kolev

Proceedings Volume 5949, 59490X (2005) https://doi.org/10.1117/12.622712

KEYWORDS: Nonlinear optics, Polymers, Chromophores, Second-harmonic generation, Molecules, Polymer thin films, Absorption, Glasses, Refractive index, Harmonic generation

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Proceedings Article | 1 July 2005 Paper

Thermoelectric properties of bismuth telluride thin films deposited by radio frequency magnetron sputtering

J. Tan, K. Kalantar-zadeh, W. Wlodarski, S. Bhargava, D. Akolekar, A. Holland, G. Rosengarten

Proceedings Volume 5836, (2005) https://doi.org/10.1117/12.609819

KEYWORDS: Bismuth, Thin films, Tellurium, Thermoelectric materials, Sputter deposition, Thin film deposition, Scanning electron microscopy, Temperature metrology, X-ray diffraction, Metals

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Proceedings Article | 28 February 2005 Paper

Effects of design geometry on SU8 polymer waveguides

Anthony Holland, Vishal Balkunje, Arnan Mitchell, Michael Austin, Mukund Raghunathan, Gorgi Kostovski

Proceedings Volume 5649, (2005) https://doi.org/10.1117/12.582267

KEYWORDS: Waveguides, Polymers, Cladding, Polymer multimode waveguides, Photoresist materials, Refractive index, Etching, Silicon, Plasma etching, Liquids

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Proceedings Article | 28 February 2005 Paper

Optimization of film thickness for thermoelectric micro-Peltier cooler

Sasikaran Kandasamy, Damien Pachoud, David Powell, Kourosh Kalantar-zadeh, Gary Rosengarten, Anthony Holland, Wojtek Wlodarski

Proceedings Volume 5649, (2005) https://doi.org/10.1117/12.582256

KEYWORDS: Thermoelectric materials, Temperature metrology, Bismuth, Antimony, Tellurium, Thin films, Semiconductors, P-type semiconductors, Connectors, Instrument modeling

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Proceedings Article | 23 February 2005 Paper

Fabrication of an integrated microfluidic and surface acoustic wave device for fluid analysis

David Karla, Anthony Holland, Gary Rosengarten, Kourosh Kalantar-Zadeh

Proceedings Volume 5650, (2005) https://doi.org/10.1117/12.582281

KEYWORDS: Microfluidics, Adhesives, Sensors, Glasses, Polymethylmethacrylate, Acoustics, Capillaries, Electrodes, Coating, Fabrication

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Proceedings Article | 23 February 2005 Paper

Cure rate and dry etch patterning of thermoset polymers

Maria-Jose Montoya, Darren Simon, Anthony Holland, Robert Shanks

Proceedings Volume 5650, (2005) https://doi.org/10.1117/12.582302

KEYWORDS: Etching, Polymers, Silicon, Ultraviolet radiation, FT-IR spectroscopy, Plasma etching, Semiconducting wafers, Optical lithography, Polishing, Silicon films

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Proceedings Article | 23 February 2005 Paper

Investigation of layered SAW sensors based on a WO3/ZnO/64° YX LiNbO3 structure with gold catalytic layer

Vijay Prasad Sivan, Samuel Ippolito, Sasikaran Kandasamy, Kourosh Kalantar-Zadeh, Wojtek Wlodarski, Anthony Holland

Proceedings Volume 5650, (2005) https://doi.org/10.1117/12.582222

KEYWORDS: Sensors, Hydrogen, Gold, Sputter deposition, Zinc oxide, Gas sensors, Computing systems, Acoustics, Atmospheric propagation, Atmospheric sensing

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Proceedings Article | 23 February 2005 Paper

Surface acoustic wave based ozone sensor with an InOx/Si3N4/36-degree YX LiTaO3 structure

Alexandru Fechete, Samuel Ippolito, Kourosh Kalantar-Zadeh, Wojtek Wlodarski, Anthony Holland

Proceedings Volume 5650, (2005) https://doi.org/10.1117/12.582076

KEYWORDS: Sensors, Indium oxide, Silicon, Ozone, Acoustics, Sputter deposition, Thin films, Oxygen, Sensor performance, Temperature metrology

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Proceedings Article | 17 January 2005 Paper

Fabrication of raised and inverted SU8 polymer waveguides

Anthony Holland, Arnan Mitchell, Vishal Balkunje, Mike Austin, Mukund Raghunathan

Proceedings Volume 5644, (2005) https://doi.org/10.1117/12.579457

KEYWORDS: Waveguides, Polymers, Cladding, Polymer multimode waveguides, Etching, Plasma etching, Microfluidics, Semiconducting wafers, Photoresist materials, Refractive index

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Proceedings Article | 2 April 2004 Paper

Patterning of SU-8 resist structures using CF4

Kaushal Vora, Anthony Holland, Muralidhar Ghantasala, Arnan Mitchell

Proceedings Volume 5276, (2004) https://doi.org/10.1117/12.523903

KEYWORDS: Etching, Surface roughness, Plasma etching, Plasma, Photoresist materials, Metals, Optical lithography, Photomasks, Ions, Photonics

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Proceedings Article | 30 March 2004 Paper

Comparison between conductometric and layered SAW hydrogen gas sensor

Samuel Ippolito, Sasikaran Kandasamy, Kourosh Kalantar-zadeh, Wojtek Wlodarski, Anthony Holland

Proceedings Volume 5274, (2004) https://doi.org/10.1117/12.522224

KEYWORDS: Sensors, Hydrogen, Gas sensors, Electrodes, Acoustics, Thin films, Transducers, Tungsten, Zinc oxide, Molybdenum

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Proceedings Article | 29 March 2004 Paper

Optimization techniques for plasma etching of thermoset polymer for microfluidic channels

Carla Cher, Anthony Holland, Gary Rosengarten

Proceedings Volume 5275, (2004) https://doi.org/10.1117/12.522808

KEYWORDS: Etching, Polymers, Aluminum, Microfluidics, Plasma etching, Polymer thin films, Silicon, Plasma, Glasses, Ultraviolet radiation

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Proceedings Article | 21 November 2001 Paper

Mass sensitivity of layered shear-horizontal surface acoustic wave devices for sensing applications

Kourosh Kalantar-Zadeh, Adrian Trinchi, Wojtek Wlodarski, Anthony Holland, Kosmas Galatsis

Proceedings Volume 4591, (2001) https://doi.org/10.1117/12.449140

KEYWORDS: Zinc oxide, Acoustics, Wave propagation, Crystals, Quartz, Sensors, Liquids, Sputter deposition, Scanning electron microscopy, Wave sensors

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Showing 5 of 27 publications

Conference Committee Involvement (1)

Microelectronics: Design, Technology, and Packaging III

5 December 2007 | Canberra, ACT, Australia

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