This course will introduce the design and packaging of present and future laser diode systems for applications in sensors, instrumentation and telecommunications. Topics will include (1) a review of laser diode optical properties; (2) collimation, focusing, circularization and astigmatism correction in laser diodes; (3) a topical overview of miniature optical components; and (4) an advanced design example.

This course provides attendees with a working knowledge of the principles of light microscopy. After reviewing the main principles of imaging, diffraction, interference and polarization used in microscopy, it discusses the most widely used microscope configurations and applications. The major system components will be covered: light sources, illumination layouts, microscope optics and image detection electronics. An overview of techniques will be given, including brightfield and darkfield imaging, phase and amplitude contrast, DIC, polarization and fluorescence microscopy. Scanning techniques like confocal and multi-photon imaging are also introduced. New technology trends like superresolution techniques (4Pi Microscopy, STED, STORM and Structured Illumination) will be summarized.