Dr. Mark A. McCord
Principal Engineer at PDF Solutions Inc
SPIE Involvement:
Author | Instructor
Publications (22)

Proceedings Article | 28 March 2014 Paper
Allen Carroll, Luca Grella, Kirk Murray, Mark McCord, Paul Petric, William Tong, Christopher Bevis, Shy-Jay Lin, Tsung-Hsin Yu, Tze-Chiang Huang, T. Wang, Wen-Chuan Wang, J. Shin
Proceedings Volume 9049, 904917 (2014) https://doi.org/10.1117/12.2048528
KEYWORDS: Mirrors, Lithography, Semiconducting wafers, Error control coding, Reflectivity, Switching, Electrodes, Data compression, Printing, Electron beam lithography

Proceedings Article | 28 March 2014 Paper
Shy-Jay Lin, T. Bao, C. Lu, S.-C. Wang, T. C. Chien, J.-J. Shin, Burn Lin, Mark McCord, Alan Brodie, Allen Carroll, Luca Grella
Proceedings Volume 9049, 90491X (2014) https://doi.org/10.1117/12.2045416
KEYWORDS: Dielectrics, Electrodes, Electron beam lithography, Microelectromechanical systems, Atomic layer deposition, Lens design, Structural design, Coating, Reflectivity, Electron beams

SPIE Journal Paper | 5 August 2013 Open Access
Luca Grella, Allen Carroll, Kirk Murray, Mark McCord, William Tong, Alan Brodie, Thomas Gubiotti, Fuge Sun, Francoise Kidwingira, Shinichi Kojima, Paul Petric, Christopher Bevis, Bart Vereecke, Luc Haspeslagh, Anil Mane, Jeffrey Elam
JM3, Vol. 12, Issue 03, 031107, (August 2013) https://doi.org/10.1117/12.10.1117/1.JMM.12.3.031107
KEYWORDS: Electrodes, Mirrors, Microelectromechanical systems, Semiconducting wafers, Tin, Electron beam lithography, Metals, Aluminum, Coating, Reflectivity

Proceedings Article | 26 March 2013 Paper
Alan Brodie, Shinichi Kojima, Mark McCord, Luca Grella, Thomas Gubiotti, Chris Bevis
Proceedings Volume 8680, 868029 (2013) https://doi.org/10.1117/12.2011908
KEYWORDS: Electron beam lithography, Monte Carlo methods, Lithography, Line width roughness, Photomasks, Electron beams, Logic, Photoresist processing, Nanoimprint lithography, Semiconductor manufacturing

Proceedings Article | 26 March 2013 Paper
Proceedings Volume 8680, 86801C (2013) https://doi.org/10.1117/12.2010865
KEYWORDS: Electroluminescence, Raster graphics, Scattering, Monte Carlo methods, Silica, Diffusion, Laser scattering, Quantization, Modulation transfer functions, Backscatter

Showing 5 of 22 publications
Course Instructor
SC100: Introduction to Electron-Beam Lithography
Electron-beam lithography is used for patterning photomasks, for writing directly on semiconductor substrates, and for research in nanofabrication. A brief history of the technique is given, and an overview is presented of the optical, mechanical, and electronic components that make an electron lithography tool. Writing methods will be compared and contrasted, including raster scan, vector scan, shaped beam, cell projection, and SCALPEL. Energy deposition physics in the resist film is described, with the resist exposure chemistry and development processes. Special attention is given to the proximity effect and correction. Tool limitations (resolution, throughput, and placement accuracy) are discussed. The course concludes with a forecast of the technology's future and how it relates to the ever-decreasing feature sizes in semiconductor manufacturing.
SC890: Electron-Beam Lithography – Current Use and Recent Advances
Electron-beam lithography is used for patterning photo masks, for writing directly on semiconductor substrates, and for R&D in nanofabrication. This course provides a brief history of the technique, and an overview of the electron-optical, mechanical, and electronic components that make an electron lithography tool. The advantages provided by this maskless, high resolution technology will be discussed together with its limitations set by the physics of charged particles. Writing methods will be compared and contrasted in their performance, including raster scan, vector scan, shaped beam, cell projection, and multi beam techniques. The most severe limitation of electron beam lithography tools is low throughput but limits of resolution and placement accuracy will be addressed as well. A particular focus will be on the recent advances in the state-of-the-art based on 'massively parallel' projection of pixels to overcome the throughput handicap. Several practical examples of these emerging lithography technologies are presented and the various technical challenges faced by the ongoing tool development efforts are discussed. You will be able to identify emerging lithographic technologies by their specific level of complexity which will enable you to judge their applicability in the semiconductor fabrication process and their opportunity for success. Applications considered for these new lithography tools under development are outlined in context of their lithographic capability, their business value and viability. The course provides a forecast of the technology's future and how it relates to the ever-decreasing feature sizes in semiconductor manufacturing.
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top