Dr. Yasin Ekinci
at Paul Scherrer Institut
SPIE Involvement:
Conference Program Committee | Editorial Board Member: Journal of Micro/Nanolithography, MEMS, and MOEMS | Editorial Board Member: Journal of Micro/Nanopatterning, Materials, and Metrology | Author
Websites:
Publications (139)

SPIE Journal Paper | 5 August 2024 Open Access
Tao Shen, Iacopo Mochi, Dongmin Jeong, Elisabeth Mueller, Paolo Ansuinelli, Jinho Ahn, Yasin Ekinci
JM3, Vol. 23, Issue 04, 049801, (August 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.4.049801
KEYWORDS: Silicon, Scanning transmission electron microscopy, Ruthenium, Reflectometry, Phase shifts, Molybdenum, Extreme ultraviolet, Attenuation, Design, Biological samples

SPIE Journal Paper | 12 July 2024 Open Access
Tao Shen, Iacopo Mochi, Dongmin Jeong, Elisabeth Mueller, Paolo Ansuinelli, Jinho Ahn, Yasin Ekinci
JM3, Vol. 23, Issue 04, 041402, (July 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.4.041402
KEYWORDS: Reflectivity, Extreme ultraviolet, Ruthenium, Silicon, Light sources and illumination, Reflectometry, Refractive index, Scanning transmission electron microscopy, Grazing incidence, Statistical modeling

SPIE Journal Paper | 11 July 2024
Xiaodong Yuan, Jinping Chen, Tianjun Yu, Yi Zeng, Xudong Guo, Shuangqing Wang, Rui Hu, Peng Tian, Michaela Vockenhuber, Dimitrios Kazazis, Yasin Ekinci, Jun Zhao, Yanqing Wu, Guoqiang Yang, Yi Li
JM3, Vol. 23, Issue 03, 034601, (July 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.3.034601
KEYWORDS: Extreme ultraviolet lithography, Electron beam lithography, Lithography, Line edge roughness, Film thickness, Etching, Scanning electron microscopy, Solubility, Line width roughness, Molecules

Proceedings Article | 10 April 2024 Presentation
Myung Mo Sung, Hyeonseok Ji, Jaehyuk Lee, Jinho Ahn, Chang Gyoun Kim, Sangsul Lee, Yasin Ekinci, Prajith Karadan, Dimitrios Kazazis
Proceedings Volume PC12953, PC129530K (2024) https://doi.org/10.1117/12.3009753
KEYWORDS: Extreme ultraviolet lithography, Extreme ultraviolet, Photoresist materials, Line width roughness, Synchrotron radiation, Monolayers, Solubility, Resistance, Reproducibility, Outgassing

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume PC12953, PC129530P (2024) https://doi.org/10.1117/12.3010388
KEYWORDS: Extreme ultraviolet lithography, Extreme ultraviolet, Mirrors, Electron beam lithography, Diffraction gratings, Diffraction, Photoresist materials, Lithography, Synchrotrons, Reflection